Capacitance-voltage measurements of monolayer MoS2 metal-oxide-semiconductor capacitors

Hae In Yang; Woong Choi

doi:10.1016/j.mee.2021.111507

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Capacitance-voltage measurements of monolayer MoS2 metal-oxide-semiconductor capacitors

Hae In Yang Woong Choi

Year: 2021 Journal: Microelectronic Engineering Vol: 238 Pages: 111507-111507 Publisher: Elsevier BV

DOI: 10.1016/j.mee.2021.111507

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Keywords:

Capacitor Monolayer Capacitance Materials science Semiconductor Optoelectronics Oxide Dielectric Voltage Nanotechnology Chemistry Electrical engineering Electrode Metallurgy

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2D Materials and Applications

Physical Sciences → Materials Science → Materials Chemistry

MXene and MAX Phase Materials

Physical Sciences → Materials Science → Materials Chemistry

Molecular Junctions and Nanostructures

Physical Sciences → Engineering → Electrical and Electronic Engineering

Capacitance-voltage measurements of monolayer MoS2 metal-oxide-semiconductor capacitors

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