Measurements of the complex anisotropic permittivity of microwave laminates

Abstract

Low-loss dielectric laminates that are routinely used in manufacturing of printed circuit boards (PCBs) are known to be anisotropic. The in-plane and the out-of-plane components of the dielectric permittivity have been so far typically determined using several approaches. In this paper we performed measurements of both components of complex permittivity of selected isotropic and anisotropic laminar materials employing a combination of a few split-post dielectric resonators (SPDRs) and one cylindrical cavity supporting a few TM0n0 modes with resonant frequencies of 2.45 GHz. No similar characterization campaign have been reported in the literature to the best of our knowledge.