Effects of dielectric screening on the excitonic and critical points properties of WS<sub>2</sub>/MoS<sub>2</sub> heterostructures

Xudan Zhu; Junbo He; Rongjun Zhang; Chunxiao Cong; Yu-Xiang Zheng; Hao Zhang; Shanwen Zhang; Liang‐Yao Chen

doi:10.1039/d0nr04591h

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Effects of dielectric screening on the excitonic and critical points properties of WS₂/MoS₂ heterostructures

Xudan Zhu Junbo He Rongjun Zhang Chunxiao Cong Yu-Xiang Zheng Hao Zhang Shanwen Zhang Liang‐Yao Chen

Year: 2020 Journal: Nanoscale Vol: 12 (46)Pages: 23732-23739 Publisher: Royal Society of Chemistry

DOI: 10.1039/d0nr04591h

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Abstract

Explore the broadband excitonic and CPs properties of WS₂/MoS₂ heterostructure by spectroscopic ellipsometry (SE).

Keywords:

Heterojunction Materials science Exciton van der Waals force Dielectric Monolayer Stacking Electron Optoelectronics Band gap Condensed matter physics Nanotechnology Chemistry Physics

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2D Materials and Applications

Physical Sciences → Materials Science → Materials Chemistry

MXene and MAX Phase Materials

Physical Sciences → Materials Science → Materials Chemistry

Perovskite Materials and Applications

Physical Sciences → Engineering → Electrical and Electronic Engineering

Effects of dielectric screening on the excitonic and critical points properties of WS₂/MoS₂ heterostructures

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