Sub-Terahertz Complex Permittivity Measurement Method Using Cavity Switches

Maxim L. Kulygin; Ilya A. Litovsky

doi:10.1007/s10762-020-00742-x

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Sub-Terahertz Complex Permittivity Measurement Method Using Cavity Switches

Maxim L. Kulygin Ilya A. Litovsky

Year: 2020 Journal: Journal of Infrared Millimeter and Terahertz Waves Vol: 41 (12)Pages: 1567-1575 Publisher: Springer Science+Business Media

DOI: 10.1007/s10762-020-00742-x

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Keywords:

Dissipation factor Terahertz radiation Permittivity Resonator Lossy compression Dielectric Materials science Relative permittivity Tangent Semiconductor Dielectric loss Q factor Optics Optoelectronics Mathematics Physics Geometry

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Microwave Engineering and Waveguides

Physical Sciences → Engineering → Electrical and Electronic Engineering

Microwave and Dielectric Measurement Techniques

Physical Sciences → Engineering → Electrical and Electronic Engineering

Photonic Crystals and Applications

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Sub-Terahertz Complex Permittivity Measurement Method Using Cavity Switches

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