JOURNAL ARTICLE

Spatial-temporal saliency action mask attention network for action recognition

Min JiangNa PanJun Kong

Year: 2020 Journal:   Journal of Visual Communication and Image Representation Vol: 71 Pages: 102846-102846   Publisher: Elsevier BV
Keywords:
Redundancy (engineering) Computer science Action recognition Artificial intelligence Pattern recognition (psychology) Frame (networking) Computer vision Key (lock) Class (philosophy) Computer network

Metrics

21
Cited By
2.10
FWCI (Field Weighted Citation Impact)
81
Refs
0.88
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Human Pose and Action Recognition
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
Multimodal Machine Learning Applications
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
Advanced Neural Network Applications
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition

Related Documents

BOOK-CHAPTER

Spatial-Temporal Co-attention Network for Action Recognition

Shuren ZhouXiangli Zeng

Communications in computer and information science Year: 2020 Pages: 302-312
JOURNAL ARTICLE

Spatial-temporal channel-wise attention network for action recognition

Lin ChenYungang LiuYongchao Man

Journal:   Multimedia Tools and Applications Year: 2021 Vol: 80 (14)Pages: 21789-21808
BOOK-CHAPTER

Spatial-Temporal Attention for Action Recognition

Dengdi SunHanqing WuZhuanlian DingBin LuoJin Tang

Lecture notes in computer science Year: 2018 Pages: 854-864
JOURNAL ARTICLE

Mining Spatial Temporal Saliency Structure for Action Recognition

Yinan LiuQingbo WuLinfeng XuBo Wu

Journal:   IEICE Transactions on Information and Systems Year: 2016 Vol: E99.D (10)Pages: 2643-2646
JOURNAL ARTICLE

Recurrent Spatial-Temporal Attention Network for Action Recognition in Videos

Wenbin DuYali WangYu Qiao

Journal:   IEEE Transactions on Image Processing Year: 2017 Vol: 27 (3)Pages: 1347-1360
© 2026 ScienceGate Book Chapters — All rights reserved.