Nanostructural Characterization of Nitrogen-Doped Graphene/ Titanium Dioxide (B)/ Silicon Composite Prepared by Dispersion Method

Abstract

In this study, nitrogen-doped graphene (NrGO)/ titanium dioxide (B) (TiO 2 (B))/ silicon composites were synthesized by dispersion method. Weight ratios of NrGO:TiO 2 (B):Si were varied as 9:1:0, 8:2:0, 7:1:2 and 6:2:2. NrGO was prepared from graphite by the Modified Hummers method, followed by heat treatment under nitrogen atmosphere and N-added by annealing with melamine. TiO 2 (B) was prepared by hydrothermal method and its phase was confirmed by X-Ray powder diffraction pattern (XRD), transmission electron microscopy (TEM) and electron diffraction pattern. Silicon was synthesized from bamboo leaves by combustion followed by magnesiothermic reduction process. The results from XRD could confirm components of the composites and the unchanged phase of TiO 2 (B). From scanning electron microscopy (SEM) images of the composites, together with energy dispersive spectroscopy (EDS) data, silicon particles were distributed on the surface of NrGO, and TiO 2 (B) nanorods which are between 0.5-5 µm in length were distributed on the surface and spaces between layers of NrGO, and NrGO/TiO 2 8:2 had the most thoroughly distribution of particles.