BOOK-CHAPTER

X-Ray Photoelectron Spectroscopy (XPS)

Abstract

Over the past five years, x-ray photoelectron spectroscopy (XPS) has become the work-horse for surface characterization and analysis of polymers and biomedical materials. This technique, also known by an older acronym - Electron Spectroscopy for Chemical Analysis, provides a quantitative elemental analysis of the top 1-20 nm of a solid surface. This chapter gives the reader a basic understanding of x-ray photoelectron spectroscopy and to provide enough information that someone knowledgeable about the paper industry could evaluate the utility of employing XPS in solving a particular type of paper manufacture or use problem. Five basic components are required to perform a XPS analysis: an x-ray source; a sample holder; a kinetic energy analyzer; an electron detector; and an ultra-high vacuum system. The function of the analyzer is to separate the photoelectrons emitted by the sample according to kinetic energy much as a monochromator separates light according to wavelength in a spectrophotometer.

Keywords:
X-ray photoelectron spectroscopy Materials science Nuclear magnetic resonance Physics

Metrics

6
Cited By
1.40
FWCI (Field Weighted Citation Impact)
1
Refs
0.76
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Electron and X-Ray Spectroscopy Techniques
Physical Sciences →  Materials Science →  Surfaces, Coatings and Films
X-ray Spectroscopy and Fluorescence Analysis
Physical Sciences →  Physics and Astronomy →  Radiation
Cultural Heritage Materials Analysis
Social Sciences →  Arts and Humanities →  Archeology

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