JOURNAL ARTICLE

A Weakly Supervised Surface Defect Detection Based on Convolutional Neural Network

Xu LiangShuai LvYong DengXiuxi Li

Year: 2020 Journal:   IEEE Access Vol: 8 Pages: 42285-42296   Publisher: Institute of Electrical and Electronics Engineers

Abstract

Surface defect detection is a critical task in product quality assurance for manufacturing lines. The deep learning-based methods recently developed for defect detection are typically trained using a supervised learning strategy and large defect sample sets. Conventional methods often require additional pixel-level labeling or bounding boxes to predict the location of defects. However, the number of required samples and the time-intensive annotation process limits the practical use of these algorithms. As such, this study proposes a weakly supervised detection framework in which a CNN model is trained to identify surface cracks in motor commutators. The model was trained using small subsets of defect samples (~5-30) and does not require a pre-trained network. This approach consists of localization and decision networks that simultaneously predict both the location and probability of defects. A new loss function was also developed to identify abnormal regions in a sample with accessible image-level labels. A collaboration learning strategy was then applied to utilize the loss function and compensate for imbalances at the pixel level. Experimental results using a small number of image-level training labels from a real industrial dataset exhibited a 99.5% recognition accuracy, which is comparable to relevant methods using pixel-level labels.

Keywords:
Computer science Artificial intelligence Convolutional neural network Bounding overwatch Pattern recognition (psychology) Sample (material) Pixel Artificial neural network Supervised learning Process (computing) Machine learning Deep learning Function (biology)

Metrics

69
Cited By
7.83
FWCI (Field Weighted Citation Impact)
41
Refs
0.97
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Industrial Vision Systems and Defect Detection
Physical Sciences →  Engineering →  Industrial and Manufacturing Engineering
Integrated Circuits and Semiconductor Failure Analysis
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Surface Roughness and Optical Measurements
Physical Sciences →  Engineering →  Computational Mechanics
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