JOURNAL ARTICLE
Mining top-k frequent patterns from uncertain databases
Tuong LeBay VoVan‐Nam HuynhNgoc Thanh NguyênSung Wook Baik
Year: 2020 Journal: Applied Intelligence Vol: 50 (5)Pages: 1487-1497 Publisher: Springer Science+Business Media
Keywords:
Computer science Scalability Data mining Rank (graph theory) Task (project management) Database Data science
Metrics
23
Cited By
5.38
FWCI (Field Weighted Citation Impact)
50
Refs
0.96
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Citation History
Topics
Data Mining Algorithms and Applications
Physical Sciences → Computer Science → Information Systems
Rough Sets and Fuzzy Logic
Physical Sciences → Computer Science → Computational Theory and Mathematics
Data Management and Algorithms
Physical Sciences → Computer Science → Signal Processing
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