MaYingPanWeiweiZhuShunzhiYinHuayiLuoJian
This paper presents an improved semi-supervised learning approach for defect prediction involving class imbalanced and limited labeled data problem. This approach employs random under-sampling tech...
Ying MaWeiwei PanShunzhi ZhuHuayi YinJian Luo
Huihua LuBojan ČukićMark V. Culp
Zhiwu ZhangXiao‐Yuan JingTiejian Wang
Ming ChengGuoqing WuMengting YuanHongyan Wan