JOURNAL ARTICLE

Structural Test Coverage Criteria for Deep Neural Networks

Youcheng SunXiaowei HuangDaniel KroeningJames J. SharpMatthew Q. HillRob Ashmore

Year: 2019 Journal:   ACM Transactions on Embedded Computing Systems Vol: 18 (5s)Pages: 1-23   Publisher: Association for Computing Machinery

Abstract

Deep neural networks (DNNs) have a wide range of applications, and software employing them must be thoroughly tested, especially in safety-critical domains. However, traditional software test coverage metrics cannot be applied directly to DNNs. In this paper, inspired by the MC/DC coverage criterion, we propose a family of four novel test coverage criteria that are tailored to structural features of DNNs and their semantics. We validate the criteria by demonstrating that test inputs that are generated with guidance by our proposed coverage criteria are able to capture undesired behaviours in a DNN. Test cases are generated using a symbolic approach and a gradient-based heuristic search. By comparing them with existing methods, we show that our criteria achieve a balance between their ability to find bugs (proxied using adversarial examples and correlation with functional coverage) and the computational cost of test input generation. Our experiments are conducted on state-of-the-art DNNs obtained using popular open source datasets, including MNIST, CIFAR-10 and ImageNet.

Keywords:
MNIST database Computer science Deep neural networks Code coverage Heuristic Artificial intelligence Machine learning Artificial neural network Software Deep learning Range (aeronautics) Test case Semantics (computer science) Data mining Programming language

Metrics

96
Cited By
7.07
FWCI (Field Weighted Citation Impact)
41
Refs
0.97
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Citation History

Topics

Adversarial Robustness in Machine Learning
Physical Sciences →  Computer Science →  Artificial Intelligence
Software Testing and Debugging Techniques
Physical Sciences →  Computer Science →  Software
Anomaly Detection Techniques and Applications
Physical Sciences →  Computer Science →  Artificial Intelligence
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