Composition dependence of structural and optical properties of GexSe100−x semiconducting thin films

Samar Moustafa; Mansour Mohamed; M.A. Abdel-Rahim

doi:10.1007/s11082-019-2049-8

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Composition dependence of structural and optical properties of GexSe100−x semiconducting thin films

Samar Moustafa Mansour Mohamed M.A. Abdel-Rahim

Year: 2019 Journal: Optical and Quantum Electronics Vol: 51 (10) Publisher: Springer Science+Business Media

DOI: 10.1007/s11082-019-2049-8

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Keywords:

Materials science Amorphous solid Crystallite Thin film Analytical Chemistry (journal) Refractive index Scanning electron microscope Spectroscopy Crystallography Nanotechnology Chemistry Composite material Optoelectronics

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Phase-change materials and chalcogenides

Physical Sciences → Materials Science → Materials Chemistry

Chalcogenide Semiconductor Thin Films

Physical Sciences → Engineering → Electrical and Electronic Engineering

Crystal Structures and Properties

Physical Sciences → Materials Science → Electronic, Optical and Magnetic Materials

Composition dependence of structural and optical properties of GexSe100−x semiconducting thin films

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