JOURNAL ARTICLE

CMOS-Compatible Optical Phased Array Powered by a Monolithically-Integrated Erbium Laser

Abstract

An advanced CMOS-compatible 300-mm-wafer silicon-photonics platform is introduced that consists of a silicon layer with eight doping masks, two silicon-nitride layers, three metal and via layers, a dicing trench for smooth edge-coupled facets, and a gain-film trench that enables interaction between the gain material and waveguide layers. The platform was used to demonstrate an electrically-steerable integrated optical phased array powered by an on-chip erbium-doped laser. Lasing with a single-mode output, 30 dB side-mode-suppression ratio, and 40 mW lasing threshold was shown, and one-dimensional beam steering with a 0.85° × 0.20° full-width at half-maximum and 30°/W electrical steering efficiency was demonstrated. This system represents the first demonstration of a rare-earth-doped laser monolithically-integrated with an active CMOS-compatible silicon-on-insulator photonics system.

Keywords:
Materials science Wafer dicing Optoelectronics Lasing threshold Trench Phased-array optics Silicon photonics Laser CMOS Hybrid silicon laser Silicon on insulator Photonics Erbium Waveguide Optics Silicon Wafer Beam steering Phased array Doping Beam (structure) Electrical engineering Layer (electronics) Engineering Nanotechnology

Metrics

56
Cited By
3.42
FWCI (Field Weighted Citation Impact)
40
Refs
0.94
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Photonic and Optical Devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Advanced Fiber Laser Technologies
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Advanced Photonic Communication Systems
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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JOURNAL ARTICLE

A Monolithically Integrated Large-Scale Optical Phased Array in Silicon-on-Insulator CMOS

SungWon ChungHooman AbediaslHossein Hashemi

Journal:   IEEE Journal of Solid-State Circuits Year: 2017 Vol: 53 (1)Pages: 275-296
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