JOURNAL ARTICLE

High Output Current Boron-Doped Diamond Metal-Semiconductor Field-Effect Transistors

Jiangwei LiuTokuyuki TerajiBo DaYasuo Koide

Year: 2019 Journal:   IEEE Electron Device Letters Vol: 40 (11)Pages: 1748-1751   Publisher: Institute of Electrical and Electronics Engineers

Abstract

Schottky diodes and metal-semiconductor field-effect transistors (MESFETs) are fabricated on a quite smooth and high boron doping level diamond epitaxial layer. Forward current density maximum for the Schottky diode is 0.6 A cm -2 with the on/off ratio higher than 10 8 . Ideality factor and barrier height for Pt metal on the boron-doped diamond are evaluated to be 1.07 and 1.38 eV, respectively. Drain current maximum for the MESFET is -0.55mA mm -1 , which is nine times higher than that of the previous report. Origin of it is possibly attributed to the good surface quality and high boron concentration for the B-diamond.

Keywords:
MESFET Diamond Schottky diode Diode Field-effect transistor Doping Materials science Schottky barrier Boron Optoelectronics Epitaxy Semiconductor Silicon Analytical Chemistry (journal) Metal Transistor Electrical engineering Nanotechnology Layer (electronics) Chemistry Metallurgy Organic chemistry

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20
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0.71
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Citation History

Topics

Diamond and Carbon-based Materials Research
Physical Sciences →  Materials Science →  Materials Chemistry
Semiconductor materials and devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Metal and Thin Film Mechanics
Physical Sciences →  Engineering →  Mechanics of Materials
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