Simultaneous Topographical and Electrochemical Mapping using Scanning Ion Conductance Microscopy – Scanning Electrochemical Microscopy (SICM-SECM)

Gabriela Mendoza; Byong Kim; Keibock Lee

doi:10.1017/s1431927619004215

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JOURNAL ARTICLE

Simultaneous Topographical and Electrochemical Mapping using Scanning Ion Conductance Microscopy – Scanning Electrochemical Microscopy (SICM-SECM)

Gabriela Mendoza Byong Kim Keibock Lee

Year: 2019 Journal: Microscopy and Microanalysis Vol: 25 (S2)Pages: 696-697 Publisher: Oxford University Press

DOI: 10.1017/s1431927619004215

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Keywords:

Scanning electrochemical microscopy Scanning ion-conductance microscopy Electrochemistry Materials science Microscopy Scanning probe microscopy Nanotechnology Scanning electron microscope Chemistry Scanning confocal electron microscopy Electrode Optics Composite material Physics

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Electrochemical Analysis and Applications

Physical Sciences → Chemistry → Electrochemistry

Force Microscopy Techniques and Applications

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Analytical Chemistry and Sensors

Physical Sciences → Chemical Engineering → Bioengineering

Simultaneous Topographical and Electrochemical Mapping using Scanning Ion Conductance Microscopy – Scanning Electrochemical Microscopy (SICM-SECM)

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