JOURNAL ARTICLE

Simultaneous Topographical and Electrochemical Mapping using Scanning Ion Conductance Microscopy – Scanning Electrochemical Microscopy (SICM-SECM)

Gabriela MendozaByong KimKeibock Lee

Year: 2019 Journal:   Microscopy and Microanalysis Vol: 25 (S2)Pages: 696-697   Publisher: Oxford University Press
Keywords:
Scanning electrochemical microscopy Scanning ion-conductance microscopy Electrochemistry Materials science Microscopy Scanning probe microscopy Nanotechnology Scanning electron microscope Chemistry Scanning confocal electron microscopy Electrode Optics Composite material Physics

Metrics

2
Cited By
0.22
FWCI (Field Weighted Citation Impact)
4
Refs
0.42
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Electrochemical Analysis and Applications
Physical Sciences →  Chemistry →  Electrochemistry
Force Microscopy Techniques and Applications
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Analytical Chemistry and Sensors
Physical Sciences →  Chemical Engineering →  Bioengineering

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