JOURNAL ARTICLE

Unsupervised fabric defect detection based on a deep convolutional generative adversarial network

Guanghua HuJunfeng HuangQinghui WangJingrong LiZhijia XuXingbiao Huang

Year: 2019 Journal:   Textile Research Journal Vol: 90 (3-4)Pages: 247-270   Publisher: SAGE Publishing

Abstract

Detecting and locating surface defects in textured materials is a crucial but challenging problem due to factors such as texture variations and lack of adequate defective samples prior to testing. In this paper we present a novel unsupervised method for automatically detecting defects in fabrics based on a deep convolutional generative adversarial network (DCGAN). The proposed method extends the standard DCGAN, which consists of a discriminator and a generator, by introducing a new encoder component. With the assistance of this encoder, our model can reconstruct a given query image such that no defects but only normal textures will be preserved in the reconstruction. Therefore, when subtracting the reconstruction from the original image, a residual map can be created to highlight potential defective regions. Besides, our model generates a likelihood map for the image under inspection where each pixel value indicates the probability of occurrence of defects at that location. The residual map and the likelihood map are then synthesized together to form an enhanced fusion map. Typically, the fusion map exhibits uniform gray levels over defect-free regions but distinct deviations over defective areas, which can be further thresholded to produce a binarized segmentation result. Our model can be unsupervisedly trained by feeding with a set of small-sized image patches picked from a few defect-free examples. The training is divided into several successively performed stages, each under an individual training strategy. The performance of the proposed method has been extensively evaluated by a variety of real fabric samples. The experimental results in comparison with other methods demonstrate its effectiveness in fabric defect detection.

Keywords:
Artificial intelligence Discriminator Computer science Pattern recognition (psychology) Segmentation Residual Image (mathematics) Encoder Pixel Computer vision Convolutional neural network Generative grammar Algorithm

Metrics

152
Cited By
14.49
FWCI (Field Weighted Citation Impact)
28
Refs
0.99
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Is in top 1%
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Citation History

Topics

Industrial Vision Systems and Defect Detection
Physical Sciences →  Engineering →  Industrial and Manufacturing Engineering
Integrated Circuits and Semiconductor Failure Analysis
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Optical measurement and interference techniques
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
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