ChemInform Abstract: Characterization of Synthetic Diamond Thin Films.

R. Ramesham; T. Roppel; Charles D. Ellis; B. F. Hajek

doi:10.1002/chin.199050353

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ChemInform Abstract: Characterization of Synthetic Diamond Thin Films.

R. Ramesham T. Roppel Charles D. Ellis B. F. Hajek

Year: 1990 Journal: ChemInform Vol: 21 (50) Publisher: Wiley

DOI: 10.1002/chin.199050353

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Abstract

Abstract Free‐standing diamond thin films and as‐deposited thin films on a Si substrate, prepared by high‐pressure, microwave plasma assisted chemical vapor deposition from a CH4/H2 mixture, are analyzed by SEM, Raman spectroscopy, and XRD.

Keywords:

Chemistry Raman spectroscopy Diamond Thin film Chemical vapor deposition Characterization (materials science) Substrate (aquarium) Carbon film Chemical engineering Nanotechnology Analytical Chemistry (journal) Organic chemistry Optics Materials science

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Topics

Diamond and Carbon-based Materials Research

Physical Sciences → Materials Science → Materials Chemistry

Metal and Thin Film Mechanics

Physical Sciences → Engineering → Mechanics of Materials

Force Microscopy Techniques and Applications

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

ChemInform Abstract: Characterization of Synthetic Diamond Thin Films.

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