近接場光学顕微鏡 (SNOM) によるバイオイメージング

JOURNAL ARTICLE

Year: 2005 Journal: Electrochemistry Vol: 73 (10)Pages: 912-916 Publisher: The Electrochemical Society of Japan

DOI: 10.5796/electrochemistry.73.912

Keywords:

Materials science

Metrics

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FWCI (Field Weighted Citation Impact)

Refs

0.41

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Near-Field Optical Microscopy

Physical Sciences → Engineering → Biomedical Engineering

Integrated Circuits and Semiconductor Failure Analysis

Physical Sciences → Engineering → Electrical and Electronic Engineering

Force Microscopy Techniques and Applications

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics