JOURNAL ARTICLE

Quantitative Analysis of thin Samples by X-Ray Diffraction

C. G. BrandtG. H. van der Vliet

Year: 1985 Journal:   Advances in X-ray Analysis Vol: 29 Pages: 203-209   Publisher: International Centre for Diffraction Data

Abstract

For phase analysis of small amounts of material in an x-ray powder diffractometer the sample is often spread on a sample mounting plate or support plate. Different types of plates on which thin samples can be mounted are: - silver membrane filters - metal or other polycrystalline plates - polymer membrane filters, for example PVC, polycarbonate, cellulose nitrate - glass slides - single crystals; cut so that no diffraction lines occur. Filters are often used to collect environmental dust; these samples can be analysed “as received,” Glass slides are inexpensive, flat, and readily available. Polycrystalline filters and plates have the disadvantage of possible line overlap with lines of the sample material (refer to figure 1), Glass plates or polymer filters have the high and curved background due to amorphous scatter as shown in figure 2.

Keywords:
Materials science Polycarbonate Diffractometer Crystallite Amorphous solid Diffraction Composite material Optics Sample preparation Crystallography Scanning electron microscope Metallurgy Chemistry

Metrics

7
Cited By
0.43
FWCI (Field Weighted Citation Impact)
1
Refs
0.67
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Topics

X-ray Diffraction in Crystallography
Physical Sciences →  Materials Science →  Materials Chemistry

Related Documents

JOURNAL ARTICLE

Quantitative x‐ray diffraction analysis on thin samples deposited on cellulose membrane filters

Stefano Battaglia

Journal:   X-Ray Spectrometry Year: 1985 Vol: 14 (1)Pages: 16-19
JOURNAL ARTICLE

Quantitative X-ray analysis of thin samples in Tem

I. PozsgaiN.P. Ilyinxx

Journal:   Proceedings annual meeting Electron Microscopy Society of America Year: 1978 Vol: 36 (1)Pages: 500-501
JOURNAL ARTICLE

Quantitative X-Ray Diffraction Analysis

L. E. CopelandRobert H. Bragg

Journal:   Analytical Chemistry Year: 1958 Vol: 30 (2)Pages: 196-201
JOURNAL ARTICLE

Quantitative X-ray diffraction from thin films

Iván K. SchullerY. Bruynseraede

Journal:   Nanostructured Materials Year: 1992 Vol: 1 (5)Pages: 387-395
JOURNAL ARTICLE

Quantitative X‐ray diffraction analysis with qualitative control of calibration samples

Torben Knudsen

Journal:   X-Ray Spectrometry Year: 1981 Vol: 10 (2)Pages: 54-56
© 2026 ScienceGate Book Chapters — All rights reserved.