Properties of Stacked Cobalt: Ruthenium Oxide Thin Film

Abstract

In the present work stacked Cobalt: Ruthenium oxide thin films have been prepared by sol-gel spin coat deposition technique. The suitable annealing temperature was 900 0 C. Various thin film properties were studied by using XRD, SEM, FTIR and EDAX analysis. The XRD showed dominant peaks of cobalt oxide and ruthenium oxide indicating crystalline nature. The SEM revealed the porous and mud-cracked morphologies with random and rough surface. FTIR depicts strong absorption band at 876.70cm -1 indicating the stretching mode of Ru-O and O-Ru-O. EDAX showed presence of ruthenium, cobalt and oxygen in the sample.