You-Hang ZhouJun LiDe-Yao ZhongXifeng LiJianhua Zhang
An aqueous solution method has been used to fabricate SrInO thin-film transistors (TFTs) in this paper. Strontium has been doped in In 2 O 3 as a carrier suppressor and proved to be associated with the reduction of the oxygen-related defect state. A small amount of Sr doping can effectively improve the stability of In 2 O 3 TFTs under bias/illumination/thermal stress. The capacitance-voltage measurement and X-ray photoelectron spectroscopy measurement are tested to observe and analyze the variation of interface defect state and oxygen vacancy. The density of states is calculated to further confirm the decrease of the total trap state with the increase of the Sr content.
You-Hang ZhouJun LiYaohua YangXifeng LiJianhua Zhang
Isam AbdullahJ. Emyr MacdonaldYen‐Hung LinThomas D. AnthopoulosNasih Hma SalahShaida Anwar KakilFahmi F. Muhammadsharif
Taegyun KimBongho JangSojeong LeeWon‐Yong LeeJaewon Jang
Mami N. FujiiTomoki MaruyamaMasahiro HoritaKiyoshi UchiyamaJi Sim JungJang Yeon KwonYukiharu Uraoka
Kazunori KurishimaToshihide NabatameTakashi OnayaKazuhito TsukagoshiAkihiko OhiNaoki IkedaTakahiro NagataAtsushi Ogura