JOURNAL ARTICLE

Electronic structure of amorphous Nb1-x Si x films studied by X-ray emission and X-ray photoelectron spectroscopy

K. SöldnerA. GrassmannG. Saemann‐IschenkoW. ZahorowskiA. Šim⫲nekG. Wiech

Year: 1989 Journal:   The European Physical Journal B Vol: 75 (1)Pages: 59-65   Publisher: Springer Science+Business Media
Keywords:
X-ray photoelectron spectroscopy Amorphous solid Analytical Chemistry (journal) Sputtering Binding energy Materials science Emission spectrum Spectroscopy Spectral line X-ray X-ray spectroscopy Thin film Atomic physics Crystallography Chemistry Nuclear magnetic resonance Physics Optics Nanotechnology

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10
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6.68
FWCI (Field Weighted Citation Impact)
17
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0.97
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Citation History

Topics

Metallic Glasses and Amorphous Alloys
Physical Sciences →  Engineering →  Mechanical Engineering
Semiconductor materials and interfaces
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Semiconductor materials and devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
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