Reliability analysis of a system by using sugeno (TSK) fuzzy model

JOURNAL ARTICLE

Year: 2018 Journal: Bulletin of Pure & Applied Sciences- Mathematics and Statistics Vol: 37e (2)Pages: 499-499

DOI: 10.5958/2320-3226.2018.00054.1

Keywords:

Reliability (semiconductor) Reliability engineering Fuzzy logic Computer science Engineering Artificial intelligence Physics

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Engineering Diagnostics and Reliability

Physical Sciences → Engineering → Mechanics of Materials

Reliability and Maintenance Optimization

Physical Sciences → Engineering → Safety, Risk, Reliability and Quality

Risk and Safety Analysis

Social Sciences → Decision Sciences → Statistics, Probability and Uncertainty