Bo YuanB.J. ThibeaultD.N. PayneJames G. MutituIvan Perez‐WürflKevin D. DobsonBrianna ConradAllen BarnettR. L. Opila
Wafer-scale Ta 2 O 5 moth-eye antireflection coatings are directly patterned on dual junction GaAsP/SiGe solar cells on Si substrates using deep UV photolithography and plasma etching. These sub-wavelength structures have an aspect ratio of 1.2, which results in excellent antireflection properties with an average reflectance of 7% over the entire 400-1100nm. Further optimizations of moth-eye and traditional double layer antireflection coatings (DLARCs) on the device using finite difference time domain (FDTD) method are performed. Optimized moth-eye structures outperform optimized traditional DLARCs with average reflection as low as 2.2% from 4001100nm.
Chih-Hung SunPeng JiangBin Jiang
Francisco RubioJ.P. DenisJ.M. AlbellaJ.M. Martı́nez-Duart
Q. ChenGraham HubbardPhilip A. ShieldsC. LiuD.W.E. AllsoppW. N. WangSteven Abbott
Francesco Galeotti (1363032)Franco Trespidi (1817521)Gianluca Timò (1817524)Mariacecilia Pasini (1363035)
Francesco GaleottiFranco TrespidiGianluca TimòMariacecilia Pasini