X-Ray Phase Contrast Imaging by Talbot-Lau Interferometer Without Phase-Stepping Device

Abstract

A new X-ray phase-contrast imaging on Talbot-Lau interferometer without phase-stepping device is proposed. A new analyzer grating is designed to replace the existing analyzer grating and scintillation conversion screen in the X-ray imaging system which is interlaced by the low-energy grid bars and the high-energy grid bars. Employing the new analyzer grating, the X-ray Talbot-Lau interferometer can obtain the differential phase-contrast image without the phase-stepping device by changing X-ray exposure energy only once. The simplified imaging system results in higher imaging efficiency and lower radiation dose. The experimental result shows that the imaging system can obtain a differential phase-contrast image of the specimen.