Electrical transport properties of polycrystalline SnO2 thin films

Qiang Li; X.H. Zhang; Tie Lin; Kuang‐Hong Gao

doi:10.1016/j.jallcom.2018.06.090

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Electrical transport properties of polycrystalline SnO2 thin films

Qiang Li X.H. Zhang Tie Lin Kuang‐Hong Gao

Year: 2018 Journal: Journal of Alloys and Compounds Vol: 764 Pages: 295-299 Publisher: Elsevier BV

DOI: 10.1016/j.jallcom.2018.06.090

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Keywords:

Dephasing Scattering Weak localization Condensed matter physics Electron Effective mass (spring–mass system) Band gap Materials science Degenerate semiconductor Electron mobility Carrier scattering Phonon scattering Thin film Electron scattering Chemistry Phonon Semiconductor Magnetoresistance Nanotechnology Optics Physics Optoelectronics

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ZnO doping and properties

Physical Sciences → Materials Science → Materials Chemistry

Gas Sensing Nanomaterials and Sensors

Physical Sciences → Engineering → Electrical and Electronic Engineering

Quantum and electron transport phenomena

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Electrical transport properties of polycrystalline SnO2 thin films

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