Structural, Optical and Electrical Properties of ITO Thin Films

Ashaq Hussain Sofi; M. A. Shah; K. Asokan

doi:10.1007/s11664-017-5915-9

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JOURNAL ARTICLE

Structural, Optical and Electrical Properties of ITO Thin Films

Ashaq Hussain Sofi M. A. Shah K. Asokan

Year: 2017 Journal: Journal of Electronic Materials Vol: 47 (2)Pages: 1344-1352 Publisher: Springer Science+Business Media

DOI: 10.1007/s11664-017-5915-9

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Keywords:

Van der Pauw method Materials science Thin film Indium tin oxide Crystallite Indium Analytical Chemistry (journal) Electrical resistivity and conductivity Raman spectroscopy Scanning electron microscope Transparent conducting film Degenerate semiconductor Hall effect Tin Diffractometer Semiconductor Optoelectronics Optics Chemistry Nanotechnology Composite material Metallurgy

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ZnO doping and properties

Physical Sciences → Materials Science → Materials Chemistry

Chalcogenide Semiconductor Thin Films

Physical Sciences → Engineering → Electrical and Electronic Engineering

Gas Sensing Nanomaterials and Sensors

Physical Sciences → Engineering → Electrical and Electronic Engineering

Structural, Optical and Electrical Properties of ITO Thin Films

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