JOURNAL ARTICLE

Instance cloned extreme learning machine

Yongshan ZhangJia WuChuan ZhouZhihua Cai

Year: 2017 Journal:   Pattern Recognition Vol: 68 Pages: 52-65   Publisher: Elsevier BV
Keywords:
Overfitting Extreme learning machine Computer science Artificial intelligence Machine learning Set (abstract data type) Cloning (programming) Pattern recognition (psychology) Data mining Artificial neural network

Metrics

52
Cited By
6.88
FWCI (Field Weighted Citation Impact)
72
Refs
0.97
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Machine Learning and ELM
Physical Sciences →  Computer Science →  Artificial Intelligence
Advanced Memory and Neural Computing
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
MicroRNA in disease regulation
Life Sciences →  Biochemistry, Genetics and Molecular Biology →  Cancer Research

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