Instance cloned extreme learning machine

Yongshan Zhang; Jia Wu; Chuan Zhou; Zhihua Cai

doi:10.1016/j.patcog.2017.02.036

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JOURNAL ARTICLE

Instance cloned extreme learning machine

Yongshan Zhang Jia Wu Chuan Zhou Zhihua Cai

Year: 2017 Journal: Pattern Recognition Vol: 68 Pages: 52-65 Publisher: Elsevier BV

DOI: 10.1016/j.patcog.2017.02.036

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Keywords:

Overfitting Extreme learning machine Computer science Artificial intelligence Machine learning Set (abstract data type) Cloning (programming) Pattern recognition (psychology) Data mining Artificial neural network

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Topics

Machine Learning and ELM

Physical Sciences → Computer Science → Artificial Intelligence

Advanced Memory and Neural Computing

Physical Sciences → Engineering → Electrical and Electronic Engineering

MicroRNA in disease regulation

Life Sciences → Biochemistry, Genetics and Molecular Biology → Cancer Research

Instance cloned extreme learning machine

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Citation History

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