In this study we investigated the morphology and growth kinetics of the interfacial intermetallic compound layers formed between a Cu substrate and SnCu based solders.We simulated the wave soldering process and subsequent ageing both at dierent temperatures and reaction times.The near eutectic Sn0.7Cu alloy and Ni enriched Sn0.7Cu0.05Nialloy were studied.Moreover, we measured the tensile strength of the simulated solder joints and analyzed fracture surfaces.
Carlos MorilloJennifer L. HayJulie Silk
S. K. KangPaul LauroDa‐Yuan ShihD. W. HendersonKarl J. Puttlitz
Fulong ZhuHonghai ZhangRongfeng GuanSheng Liu