A novel learning-based dissimilarity metric for rigid and non-rigid medical image registration by using Bhattacharyya Distances

Ronald W. K. So; Albert C. S. Chung

doi:10.1016/j.patcog.2016.09.004

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A novel learning-based dissimilarity metric for rigid and non-rigid medical image registration by using Bhattacharyya Distances

Ronald W. K. So Albert C. S. Chung

Year: 2016 Journal: Pattern Recognition Vol: 62 Pages: 161-174 Publisher: Elsevier BV

DOI: 10.1016/j.patcog.2016.09.004

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Keywords:

Image registration Bhattacharyya distance Rigid transformation Artificial intelligence Metric (unit) Markov random field Robustness (evolution) Mutual information Computer science Computer vision Pattern recognition (psychology) Mathematics Image (mathematics) Image segmentation

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Medical Image Segmentation Techniques

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

Medical Imaging Techniques and Applications

Health Sciences → Medicine → Radiology, Nuclear Medicine and Imaging

Brain Tumor Detection and Classification

Life Sciences → Neuroscience → Neurology

A novel learning-based dissimilarity metric for rigid and non-rigid medical image registration by using Bhattacharyya Distances

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