Permittivity measurements for high-permittivity materials at NMIJ using resonator methods

Abstract

This paper describes material characterizations for high-permittivity materials with the dielectric constant up to 3,000 by using resonator methods. Samples considered in this study are substrates with 0.5 mm in the thickness. Two types of measurement methods have been proposed: rectangular resonator method with controlling a sample insertion length, and waveguide reflection method with a sample terminated by a short circuit. Both methods have the advantage of providing nondestructive measurements. Numerical calculations for both and experimental measurements for the latter have been performed to investigate their validity and ranges of application.