JOURNAL ARTICLE
Radiation effects and radiation hardness solutions for single-walled carbon nanotube-based thin film transistors and logic devices
Yudan ZhaoDongqi LiLin XiaoJunku LiuXiaoyang XiaoGuanhong LiYuanhao JinKaili JiangJiaping WangShoushan FanQunqing Li
Year: 2016 Journal: Carbon Vol: 108 Pages: 363-371 Publisher: Elsevier BV
Keywords:
Materials science Carbon nanotube Optoelectronics Ambipolar diffusion Doping Radiation hardening Transistor CMOS Radiation Thin-film transistor Threshold voltage Nanotechnology Voltage Electron Electrical engineering Optics Layer (electronics)
Metrics
26
Cited By
1.60
FWCI (Field Weighted Citation Impact)
51
Refs
0.83
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Citation History
Topics
Carbon Nanotubes in Composites
Physical Sciences → Materials Science → Materials Chemistry
Diamond and Carbon-based Materials Research
Physical Sciences → Materials Science → Materials Chemistry
Radiation Effects in Electronics
Physical Sciences → Engineering → Electrical and Electronic Engineering
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