JOURNAL ARTICLE

Characterization of MgF2 thin films using optical tunneling photoacoustic spectroscopy

Keywords:
Materials science Refractive index Ellipsometry Reflectometry Thin film Optics Characterization (materials science) Wavelength Surface plasmon resonance Spectroscopy Optoelectronics Nanotechnology Computer science Physics Nanoparticle

Metrics

9
Cited By
0.87
FWCI (Field Weighted Citation Impact)
64
Refs
0.73
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Photoacoustic and Ultrasonic Imaging
Physical Sciences →  Engineering →  Biomedical Engineering
Thermography and Photoacoustic Techniques
Physical Sciences →  Engineering →  Mechanics of Materials
Advanced Fiber Optic Sensors
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
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