Characterization of MgF2 thin films using optical tunneling photoacoustic spectroscopy

Benjamin Goldschmidt; Anna M. Rudy; Charissa A. Nowak; Dylan P. Macoubrie; John A. Viator; Heather K. Hunt

doi:10.1016/j.optlastec.2015.04.019

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Characterization of MgF2 thin films using optical tunneling photoacoustic spectroscopy

Benjamin Goldschmidt Anna M. Rudy Charissa A. Nowak Dylan P. Macoubrie John A. Viator Heather K. Hunt

Year: 2015 Journal: Optics & Laser Technology Vol: 73 Pages: 146-155 Publisher: Elsevier BV

DOI: 10.1016/j.optlastec.2015.04.019

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Keywords:

Materials science Refractive index Ellipsometry Reflectometry Thin film Optics Characterization (materials science) Wavelength Surface plasmon resonance Spectroscopy Optoelectronics Nanotechnology Computer science Physics Nanoparticle

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Photoacoustic and Ultrasonic Imaging

Physical Sciences → Engineering → Biomedical Engineering

Thermography and Photoacoustic Techniques

Physical Sciences → Engineering → Mechanics of Materials

Advanced Fiber Optic Sensors

Physical Sciences → Engineering → Electrical and Electronic Engineering

Characterization of MgF2 thin films using optical tunneling photoacoustic spectroscopy

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