JOURNAL ARTICLE

Failure Analysis of RuO2 Thick Film Chip Resistors

S. PODDAG. CASSANELLIM. VANZIFANTINI, Fausto

Year: 2004 Journal:   Microelectronics Reliability Vol: 44 (9-11)Pages: 1763-1767   Publisher: Elsevier BV
Keywords:
Reliability (semiconductor) Reliability engineering Electronics Field (mathematics) Computer science Resistor Engineering Electrical engineering

Metrics

3
Cited By
0.30
FWCI (Field Weighted Citation Impact)
0
Refs
0.66
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Semiconductor materials and devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Electronic Packaging and Soldering Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Advancements in Semiconductor Devices and Circuit Design
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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