JOURNAL ARTICLE
Failure Analysis of RuO2 Thick Film Chip Resistors
S. PODDAG. CASSANELLIM. VANZIFANTINI, Fausto
Year: 2004 Journal: Microelectronics Reliability Vol: 44 (9-11)Pages: 1763-1767 Publisher: Elsevier BV
Keywords:
Reliability (semiconductor) Reliability engineering Electronics Field (mathematics) Computer science Resistor Engineering Electrical engineering
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3
Cited By
0.30
FWCI (Field Weighted Citation Impact)
0
Refs
0.66
Citation Normalized Percentile
Is in top 1%
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Citation History
Topics
Semiconductor materials and devices
Physical Sciences → Engineering → Electrical and Electronic Engineering
Electronic Packaging and Soldering Technologies
Physical Sciences → Engineering → Electrical and Electronic Engineering
Advancements in Semiconductor Devices and Circuit Design
Physical Sciences → Engineering → Electrical and Electronic Engineering
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