Characterization of Metal‐Organic Frameworks Using X‐ray Diffraction

Abstract

Abstract Metal‐organic frameworks (MOFs) are nanoporous materials with a very large inner surface. Selected MOFs with a high potential for industrial application are investigated and characterized using X‐ray diffraction. During this process, impurities and defective batches can be detected at an early stage and the manufacturing processes could be refined or corrected accordingly. In addition, important information on the real structures of the products is obtained. It is thus possible to achieve the target structure and to tailor particle properties to the application profile.