Microstructure-mechanical properties relationship in conducting polypyrrole films

Xishu Wang; Jingkun Xu; Gaoquan Shi; Xiao Lu

doi:10.1023/a:1021093211625

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Microstructure-mechanical properties relationship in conducting polypyrrole films

Xishu Wang Jingkun Xu Gaoquan Shi Xiao Lu

Year: 2002 Journal: Journal of Materials Science Vol: 37 (24)Pages: 5171-5176 Publisher: Springer Science+Business Media

DOI: 10.1023/a:1021093211625

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Keywords:

Materials science Scanning electron microscope Polypyrrole Microstructure Ultimate tensile strength Composite material Polymer Brittleness Electrochemistry Electrolyte Anode Electrode Polymerization

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Conducting polymers and applications

Physical Sciences → Materials Science → Polymers and Plastics

Advanced Sensor and Energy Harvesting Materials

Physical Sciences → Engineering → Biomedical Engineering

Analytical Chemistry and Sensors

Physical Sciences → Chemical Engineering → Bioengineering

Microstructure-mechanical properties relationship in conducting polypyrrole films

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