XPS and Raman study of slope-polished Cu(In,Ga)Se2 thin films

Gun Yeol Beak; Chan‐Wook Jeon

doi:10.1007/s13391-016-6044-y

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XPS and Raman study of slope-polished Cu(In,Ga)Se2 thin films

Gun Yeol Beak Chan‐Wook Jeon

Year: 2016 Journal: Electronic Materials Letters Vol: 12 (3)Pages: 399-403 Publisher: Springer Science+Business Media

DOI: 10.1007/s13391-016-6044-y

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Keywords:

Raman spectroscopy X-ray photoelectron spectroscopy Materials science Thin film Analytical Chemistry (journal) Diffraction Solar cell Optics Nanotechnology Optoelectronics Chemical engineering Chemistry Physics

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Chalcogenide Semiconductor Thin Films

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Copper-based nanomaterials and applications

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XPS and Raman study of slope-polished Cu(In,Ga)Se2 thin films

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