Structural Properties of Spin Coated Multilayered Cupric Oxide Thin Films

Abstract

CuO thin films were spin-coated at 1500, 2200 and 2400 rpm for 30 sec, and subsequently annealed at 150–550°C for 1 h. Multi-layered CuO thin films were prepared including three and five layers. These thin films were characterized using XRD, Fourier-Transform Infrared Spectroscopy (FTIR) and polarizing light microscopy. The XRD and FTIR analysis confirmed the crystallization of CuO phase in thin films annealed above 350°C, and corresponding crystallite sizes were observed to be increasing with the annealing temperature. The Scherrer formula was applied for (111) and peaks of XRD patterns of CuO thin films. According to the data of peak, average crystallite size increased from 0.801 to 55.2 0 A as annealing temperature was increased from 350 to 500°C. In FTIR spectrum, peak corresponding to Cu-O bond appeared at wavelength of 532.4 cm -1 above annealing temperature of 350°C. Keywords: Spin coating, CuO, XRD, FTIR, Structure Cite this Article Samarasekara P, Premasiri NGKVM. Structural Properties of Spin Coated Multilayered Cupric Oxide Thin Films. Research & Reviews: Journal of Physics (RRJoPHY). 2015; 4(2): 8–13p.