JOURNAL ARTICLE

Evolution of Structural and Electronic Properties in Boron-doped Nanocrystalline Silicon Thin Films

Hyun Jung LeeAndrei SazonovArokia Nathan

Year: 2007 Journal:   MRS Proceedings Vol: 989   Publisher: Cambridge University Press
Keywords:
Materials science Plasma-enhanced chemical vapor deposition Raman spectroscopy Nanocrystalline silicon Doping Nanocrystalline material Silane Amorphous solid Boron Crystallinity Analytical Chemistry (journal) Chemical vapor deposition Thin film Conductivity Silicon Amorphous silicon Nanotechnology Optoelectronics Composite material Crystalline silicon Crystallography Optics Physical chemistry

Metrics

4
Cited By
1.24
FWCI (Field Weighted Citation Impact)
10
Refs
0.83
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Topics

Thin-Film Transistor Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Silicon Nanostructures and Photoluminescence
Physical Sciences →  Materials Science →  Materials Chemistry
Silicon and Solar Cell Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
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