JOURNAL ARTICLE

Bias Stress Induced Instabilities in Amorphous Silicon Nitride / Crystalline Silicon and Amorphous Silicon Nitride / Amorphous Silicon Structures

Jerzy KanickiC. GodetA. V. Gelatos

Year: 1991 Journal:   MRS Proceedings Vol: 219   Publisher: Cambridge University Press
Keywords:
Materials science Dangling bond Nanocrystalline silicon Amorphous silicon Silicon nitride Amorphous solid Silicon Stress (linguistics) Nitride Strained silicon Optoelectronics Crystalline silicon Composite material Crystallography Chemistry Layer (electronics)

Metrics

6
Cited By
0.43
FWCI (Field Weighted Citation Impact)
12
Refs
0.70
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Topics

Thin-Film Transistor Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Semiconductor materials and devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Silicon Nanostructures and Photoluminescence
Physical Sciences →  Materials Science →  Materials Chemistry

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