Diffusion Profile Measurement Using SIMS in La&lt;sub&gt;0.9&lt;/sub&gt;Sr&lt;sub&gt;0.1&lt;/sub&gt;FeO&lt;sub&gt;3&lt;/sub&gt; and La&lt;sub&gt;0.9&lt;/sub&gt;Sr&lt;sub&gt;0.1&lt;/sub&gt;CoO&lt;sub&gt;3&lt;/sub&gt;

Takamasa Ishigaki; Shigeru Yamauchi; Kazuo Fueki

doi:10.2109/jcersj1950.95.1106_1031

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Diffusion Profile Measurement Using SIMS in La0.9Sr0.1FeO3 and La0.9Sr0.1CoO3

Takamasa Ishigaki Shigeru Yamauchi Kazuo Fueki

Year: 1987 Journal: Journal of the Ceramic Association Japan Vol: 95 (1106)Pages: 1031-1033 Publisher: Ceramic Society of Japan

DOI: 10.2109/jcersj1950.95.1106_1031

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Abstract

The diffusion profiles of 18O in La0.9Sr0.1FeO3 and La0.9Sr0.1CoO3 were measured with a secondary ion mass spectrometer. The gas-solid oxygen isotopic exchange reaction was strongly limited by a surface reaction. The depth profile data were carefully treated and the tracer diffusion coefficient of oxide ions in the oxides was determined successfully.

Keywords:

Analytical Chemistry (journal) Diffusion Chemistry TRACER Ion Secondary ion mass spectrometry Oxygen Oxide Radiochemistry Physics Thermodynamics Nuclear physics

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Diffusion Profile Measurement Using SIMS in La<sub>0.9</sub>Sr<sub>0.1</sub>FeO<sub>3</sub> and La<sub>0.9</sub>Sr<sub>0.1</sub>CoO<sub>3</sub>

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