Ridged waveguide as a device for measuring the dielectric permittivity of materials

A. V. Donchenko; G. F. Zargano; V. V. Zemlakov

doi:10.1109/apede.2014.6958770

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Ridged waveguide as a device for measuring the dielectric permittivity of materials

A. V. Donchenko G. F. Zargano V. V. Zemlakov

Year: 2014 Pages: 326-333

DOI: 10.1109/apede.2014.6958770

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Abstract

The article discusses the concept of a device for measuring the permittivity of dielectric materials. This device is a single-ridged waveguide. Measurements are supposed to be carried out by the transmission of electromagnetic waves and assessment of the distribution characteristics.

Keywords:

Permittivity Dielectric Materials science Waveguide Dielectric permittivity Optoelectronics Electromagnetic radiation Relative permittivity Transmission (telecommunications) Acoustics Optics Electronic engineering Electrical engineering Engineering Physics

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Microwave and Dielectric Measurement Techniques

Physical Sciences → Engineering → Electrical and Electronic Engineering

Sensor Technology and Measurement Systems

Physical Sciences → Computer Science → Computer Networks and Communications

Ridged waveguide as a device for measuring the dielectric permittivity of materials

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