JOURNAL ARTICLE

Quantitative Auger Electron Spectroscopy

Teiichi HOMMA

Year: 1986 Journal:   Hyomen Kagaku Vol: 7 (3)Pages: 216-223

Abstract

A short review of surface chemical analysis by Auger Electron Spectroscopy is presented. Following a brief ntroduction of the basis of quantification in AES, each of the Auger parameters causing inaccuracies in measurements is discussed. These include both specimen and instrument dependent parameters. A result of a round robin involving relative intensity measurements on high purity samples of copper and gold is referred to. Causes of the spread in the relative intensities are considered. The importance of the instrument dependent parameters is discussed. The need for standards (e.g., calibration methods, operating procedures, and data analysis) is emphasized to ensure that data of known accuracy can be obtained routinely. Recent trends and developments in quantification are given.

Keywords:
Auger electron spectroscopy Auger Calibration Spectroscopy Electron spectroscopy Electron Analytical Chemistry (journal) Auger effect Materials science Atomic physics Chemistry Physics Nuclear physics

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Topics

Electron and X-Ray Spectroscopy Techniques
Physical Sciences →  Materials Science →  Surfaces, Coatings and Films
Surface and Thin Film Phenomena
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Corrosion Behavior and Inhibition
Physical Sciences →  Materials Science →  Materials Chemistry

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