Dielectric Measurement Of Multi-Layered Medium Using An Open-Ended Waveguide

O. Tantot; M. Chatard-Moulin; P. Guillon

doi:10.1557/proc-430-245

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Dielectric Measurement Of Multi-Layered Medium Using An Open-Ended Waveguide

O. Tantot M. Chatard-Moulin P. Guillon

Year: 1996 Journal: MRS Proceedings Vol: 430 Publisher: Cambridge University Press

DOI: 10.1557/proc-430-245

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Keywords:

Materials science Microwave Reflection coefficient Air gap (plumbing) Reflection (computer programming) Waveguide Permittivity Characterization (materials science) Dielectric Optoelectronics Dielectric permittivity Optics Acoustics Composite material Computer science Nanotechnology Telecommunications Physics

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Microwave and Dielectric Measurement Techniques

Physical Sciences → Engineering → Electrical and Electronic Engineering

Microwave Engineering and Waveguides

Physical Sciences → Engineering → Electrical and Electronic Engineering

Gyrotron and Vacuum Electronics Research

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Dielectric Measurement Of Multi-Layered Medium Using An Open-Ended Waveguide

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