JOURNAL ARTICLE

Interface roughness correlations in Ge/Si/Si1−xGexquantum well heterostructures

Yuichi YamaguchiP. M. ReimerJ. H. LiOsami SakataHidetoshi Hashizume

Year: 1996 Journal:   Acta Crystallographica Section A Foundations of Crystallography Vol: 52 (a1)Pages: C468-C468   Publisher: Wiley
Keywords:
Heterojunction Germanium Silicon Interface (matter) Materials science Surface finish Condensed matter physics Physics Optoelectronics

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Integrated Circuits and Semiconductor Failure Analysis
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Semiconductor materials and devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Advanced Surface Polishing Techniques
Physical Sciences →  Engineering →  Biomedical Engineering
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