This study explores a strategy of using the phosphonic acid derivative (11-((12-(anthracen-2-yl)dodecyl)oxy)-11-oxoundecyl) phosphonic acid (ADO-phosphonic acid) as self-assembled monolayers (SAMs) on a Si/SiO2 surface to induce the crystallization of rubrene in vacuum deposited thin film transistors, which showed a field-effect mobility as high as 0.18 cm2/(Vs). It is found that ADO-phosphonic acid SAMs play a unique role in modulating the morphology of rubrene to form a crystalline film in the thin-film transistors.
Kenjiro FukudaTomoyuki YokotaKazunori KuribaraTsuyoshi SekitaniUte ZschieschangHagen KlaukTakao Someya
Ivan ShuvalovRhys LawsonHong MaAlex K.‐Y. JenLarry R. Dalton
Rachana AcharyaBoyu PengPaddy K. L. ChanGuido SchmitzHagen Klauk
Ulrike KraftUte ZschieschangFrederik AnteDaniel KälbleinClaudia KamellaKonstantin AmsharovMartin JansenKlaus KernEdwin WeberHagen Klauk