JOURNAL ARTICLE
Nanoscale Properties of SrBi2Ta2O9 Thin Films
Alexei GruvermanChiharu IsobeMasahiro Tanaka
Year: 2000 Journal: MRS Proceedings Vol: 655 Publisher: Cambridge University Press
Keywords:
Materials science Nanoscopic scale Piezoresponse force microscopy Polarization (electrochemistry) Thin film Electrode Dielectric Ferroelectricity Scanning probe microscopy Optoelectronics Nanotechnology
Metrics
2
Cited By
0.00
FWCI (Field Weighted Citation Impact)
27
Refs
0.20
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Topics
Ferroelectric and Piezoelectric Materials
Physical Sciences → Materials Science → Materials Chemistry
Electronic and Structural Properties of Oxides
Physical Sciences → Materials Science → Materials Chemistry
Microwave Dielectric Ceramics Synthesis
Physical Sciences → Engineering → Electrical and Electronic Engineering
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