JOURNAL ARTICLE

Nanoscale Properties of SrBi2Ta2O9 Thin Films

Alexei GruvermanChiharu IsobeMasahiro Tanaka

Year: 2000 Journal:   MRS Proceedings Vol: 655   Publisher: Cambridge University Press
Keywords:
Materials science Nanoscopic scale Piezoresponse force microscopy Polarization (electrochemistry) Thin film Electrode Dielectric Ferroelectricity Scanning probe microscopy Optoelectronics Nanotechnology

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Topics

Ferroelectric and Piezoelectric Materials
Physical Sciences →  Materials Science →  Materials Chemistry
Electronic and Structural Properties of Oxides
Physical Sciences →  Materials Science →  Materials Chemistry
Microwave Dielectric Ceramics Synthesis
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
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