JOURNAL ARTICLE

High-Aspect Ratio Planarization using Self-Leveling Materials

Michelle FowlerDongshun BaiC. W. PlanjeXie Shao

Year: 2012 Journal:   Additional Conferences (Device Packaging HiTEC HiTEN & CICMT) Vol: 2012 (DPC)Pages: 002567-002586   Publisher: International Microelectronics Assembly and Packaging Society

Abstract

There are an increasing number of applications in the microelectronics industry that require materials that can fill and planarize high-aspect ratio topography. These applications call for the formation of a flat coating surface without the use of high bake temperatures or high-pressure processes. Potential device markets include MEMS, 3D-ICs, LEDs, semiconductors, flat panel displays and related microelectronic and optoelectronic devices. Various polymeric coating materials have been developed that have intrinsic self-leveling properties and are able to fill deep trenches and holes found on microelectronic substrates without forming voids. These new materials are able to reflow at modest baking temperatures (50–100 °C) and can fill high-aspect ratio features (10:1) by spin coating single or multiple layers of material over the topography. Several of these polymeric materials remain soluble in TMAH (and other aqueous bases), some are photosensitive, and all materials are compatible with industry-accepted solvents. Results from extended process development work on self-leveling polymeric materials will be discussed and comparisons made to industry-accepted practices.

Keywords:
Microelectronics Chemical-mechanical planarization Materials science Coating Aspect ratio (aeronautics) Nanotechnology Flat panel Polymer Composite material Polishing Computer science

Metrics

1
Cited By
0.51
FWCI (Field Weighted Citation Impact)
1
Refs
0.72
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Adhesion, Friction, and Surface Interactions
Physical Sciences →  Engineering →  Mechanics of Materials
Advanced Surface Polishing Techniques
Physical Sciences →  Engineering →  Biomedical Engineering
Manufacturing Process and Optimization
Physical Sciences →  Engineering →  Industrial and Manufacturing Engineering

Related Documents

JOURNAL ARTICLE

Planarization of Deep Structures Using Self-Leveling Materials

Dongshun BaiMichelle FowlerCurtis PlanjeXie Shao

Journal:   IMAPSource Proceedings Year: 2012 Vol: 2012 (1)Pages: 000079-000083
JOURNAL ARTICLE

Nanoimprint planarization of high aspect ratio nanostructures using inorganic and organic resist materials

Allan ChangChristophe PérozXiaogan LiangScott DhueyB. HarteneckStefano Cabrini

Journal:   Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Year: 2009 Vol: 27 (6)Pages: 2877-2881
JOURNAL ARTICLE

Self-masked high-aspect-ratio polymer nanopillars

Ming‐Hung ChenYun-Ju ChuangFan‐Gang Tseng

Journal:   Nanotechnology Year: 2008 Vol: 19 (50)Pages: 505301-505301
JOURNAL ARTICLE

The Optimum Binder Ratio for High-Strength Self-Leveling Material

Jin‐Man Kim

Journal:   Journal of the Korea Institute of Building Construction Year: 2002 Vol: 2 (4)Pages: 89-98
© 2026 ScienceGate Book Chapters — All rights reserved.