A 128-Stage CMOS TDI Image Sensor With On-Chip Digital Accumulator

Abstract

A 128-stage CMOS time delay integration (TDI) image sensor with on-chip digital accumulator was presented in this paper. By using two sets of sampling capacitors and an optimized timing, the on-chip column parallel cyclic analog-todigital converter (ADC) in the sensor conducts the correlated double sampling, digital program gain amplifying, and A/D conversion all altogether in one ADC's conversion time simultaneously. An on-chip digital accumulator suitable for this sensor is also proposed. A prototype 1024 × 128 CMOS TDI image sensor is fabricated in the 0.18-μm CMOS technology, and the measurement results proof that the pixels and readout circuits in the sensor work properly. With a line rate of 3875 lines/s, the sensor costs a power consumption of 290 mW and a silicon area of 18.2 mm × 18.9 mm. The estimated maximum sensitivity of the fabricated sensor is 2010 V/lux· sec. This paper is suitable for applications in low-illumination, high scanning speed, and remote sensing systems.