JOURNAL ARTICLE

Advanced pixel architectures for scientific image sensors

R.E. CoathR. TurchettaJ. CrooksMatthew D. WilsonAdam Godbeer

Year: 2009 Journal:   CERN Document Server (European Organization for Nuclear Research)   Publisher: European Organization for Nuclear Research

Abstract

We present recent developments from two projects targeting advanced pixel architectures for scientific applications. Results are reported from FORTIS, a sensor demonstrating variants on a 4T pixel architecture. The variants include differences in pixel and diode size, the in-pixel source follower transistor size and the capacitance of the readout node to optimise for low noise and sensitivity to small amounts of charge. Results are also reported from TPAC, a complex pixel architecture with ~160 transistors per pixel. Both sensors were manufactured in the 0.18μm INMAPS process, which includes a special deep p-well layer and fabrication on a high resistivity epitaxial layer for improved charge collection efficiency.

Keywords:
Pixel Transistor Image sensor Optoelectronics Noise (video) Node (physics) Capacitance Sensitivity (control systems) Diode Materials science Computer science Electronic engineering Electrical engineering Artificial intelligence Engineering Physics Image (mathematics) Voltage

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